{"version":"1.0","provider_name":"Tichawa Vision GmbH","provider_url":"https:\/\/tichawa-vision.de\/en","author_name":"Rafael Klotz","author_url":"https:\/\/tichawa-vision.de\/en\/author\/rklotz\/","title":"Wafer inspection with Contact Image Sensor - Tichawa Vision GmbH","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"jlaod2givD\"><a href=\"https:\/\/tichawa-vision.de\/en\/2024\/wafer-inspection-with-contact-image-sensor\/\">Wafer inspection with Contact Image Sensor<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/tichawa-vision.de\/en\/2024\/wafer-inspection-with-contact-image-sensor\/embed\/#?secret=jlaod2givD\" width=\"600\" height=\"338\" title=\"&#8220;Wafer inspection with Contact Image Sensor&#8221; &#8212; Tichawa Vision GmbH\" data-secret=\"jlaod2givD\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/\/# sourceURL=https:\/\/tichawa-vision.de\/en\/wp-includes\/js\/wp-embed.min.js\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/tichawa-vision.de\/en\/wp-content\/uploads\/sites\/2\/2024\/02\/Bild_fur_LinkedIn.png","thumbnail_width":2899,"thumbnail_height":628,"description":"Special requirements for the inspection of wafers Optical wafer inspection plays an important role in semiconductor production in order to manufacture microchips with flawless quality. Optical systems are used to detect scratches, defects or particles on wafers.The requirements placed on the camera system used for this are very demanding. A high resolution is required to [&hellip;]"}