Properties of VUCIS Magnetic particle inspection is a non-destructive testing method used to identify cracks and defects in magnetic materials. In this method, a fine magnetic powder is applied to the surface of the workpiece. The powder accumulates in the cracks and makes them visible. By using UV light as an illumination source, the cracks […]
Protection for BoroCIS against imitations We are pleased to announce that after a long wait, the patent for our innovative BoroCIS has finally been approved by the Munich Patent Office. This ground-breaking technology, in combination with our patented RingCIS, enables our customers to carry out a comprehensive internal and external inspection of pipes, tubes and […]
Special requirements for the inspection of wafers Optical wafer inspection plays an important role in semiconductor production in order to manufacture microchips with flawless quality. Optical systems are used to detect scratches, defects or particles on wafers.The requirements placed on the camera system used for this are very demanding. A high resolution is required to […]