Wafer inspection with Contact Image Sensor

Special requirements for the inspection of wafers Optical wafer inspection plays an important role in semiconductor production in order to manufacture microchips with flawless quality. Optical systems are used to detect scratches, defects or particles on wafers.The requirements placed on the camera system used for this are very demanding. A high resolution is required to […]

New product key for various illuminations

Change of product key from VTCIS to VUCIS Tichawa Vision is changing the type code for the latest Contact Image Sensor generation. Due to many new innovative developments in the field of lighting and optics, this is the ideal time to make the key a little more intuitive. The key changes from VTCIS to VUCIS […]

VUCIS Illumination Scheme

The Tichawa Vision VUCIS combines a built-in intelligent programmable ultra high speed Illumination Controller with a wide choice of illumination colors and geometries to get the best possible images for conventional or AI based Image Processing. The Illumination Controller is built around a phase sequencer and a Color Mix Table, both completely under user control. […]

Chip on Board at Tichawa Vision

In the future, Tichawa Vision will manufacture the sensor boards in-house The heart of our products are the sensor boards. These carry the sensor chips, which scan the image in a similar way to a line scan camera. The difference to a line scan camera is that many sensor chips have to be lined up […]

New design for RingCIS – Adjustable for different tube diameters

For the RingCIS with adjustable focus the design and construction is completed. From now on it is possible to use the same RingCIS for different tube diameters. For lines where different types of tubes are processed you can use your quality control with only one RingCIS. This requires only a simple adjustment of the head when […]

Reading Tyre Labels with ShapeFromShading CIS

With the ShapeFromShading CIS from Tichawa Vision, embossed lettering on dark materials can be easily scanned and evaluated, such as the lettering on a tyre shown here. The Shape-from-Shading technique dates back to the 70s. Tichawa Vision has integrated this technology into the CIS and thus created a unique product worldwide. As can also be seen […]

New view for the BoroCIS

Tube or pipe bottoms come into focus. The field of view for the BoroCIS has been significantly expanded. In addition to pipe or tube inner walls, the BoroCIS can also scan the bottom in parallel. This means that even more information can be obtained in a single immersion process. Now scratches, foreign bodies, coating gaps and […]

Upgrade on the Shape from Shading device

Shape from Shading extended for high speeds Our previous Shape from Shading CIS sensors were often limited in speed by the amount of light available. We have advanced the illumination control with a completely new approach so that we can provide up to four times the amount of light without compromising the LED lifetime. The Shape […]