VISION 2026 in Stuttgart, held from October 6–8, provided an excellent opportunity to showcase the latest developments in industrial machine vision and discuss real-world inspection challenges with customers, partners, and industry experts. We would like to sincerely thank everyone who visited us in Hall 10, Booth H20. Our exhibition focused on Contact Image Sensor (CIS) […]
Tag Archives: Waferinspection
Tichawa Vision at SEMICON Europe 2025
From November 18–21, Tichawa Vision will be exhibiting at SEMICON Europa in Munich. In Hall C1, Booth 643, we will be presenting the innovative high-resolution BergKristall WaferCIS. Visitors are cordially invited to learn about the technology and exchange ideas on site. BergKristall live demo at SEMICON Europa 2025 At SEMICON Europa 2025, Europe’s largest electronics […]
Wafer inspection with Contact Image Sensor
Special requirements for the inspection of wafers Optical wafer inspection plays an important role in semiconductor production in order to manufacture microchips with flawless quality. Optical systems are used to detect scratches, defects or particles on wafers.The requirements placed on the camera system used for this are very demanding. A high resolution is required to […]


